| Sample preparation for the optical, scanning electron (SEM) and transmission electron (TEM) microscopy | |
|---|---|
| Laboratory | D10 |
| Equipment | Band and wire saw, grinding, polishing machine, ultrasonic cutting, mechanical thinning and ion erosion thinning |
| Field | Chemical analysis |
| The platform | Microscopy |
| Technics | Electron microscopy |
| Contact person | Gregor Kapun (TEM analysis) Ivan Jerman (SEM analysis) |
| Description | |

