Sample preparation for the optical, scanning electron (SEM) and transmission electron (TEM) microscopy | |
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Laboratory | D10 |
Equipment | Band and wire saw, grinding, polishing machine, ultrasonic cutting, mechanical thinning and ion erosion thinning |
Field | Chemical analysis |
The platform | Microscopy |
Technics | Electron microscopy |
Contact person | Gregor Kapun (TEM analysis) Ivan Jerman (SEM analysis) |
Description |