Structural and chemical analysis of nanoparticles, ceramics and metals at the atomic level (Cs probe corrected scanning transmission electron microscopy - STEM) | |
---|---|
Laboratory | D10 |
Equipment | Cs probe corrected scanning transmission electron microscopy - STEM |
Field | Structural and chemical analysis |
Platform | Microscopy |
Technics | Scanning transmission electron microscopy |
Contact person | Goran Dražić goran.drazic(at)ki.si +386 1 4760 514, +386 1 4760 555 |
Description | With the state-of-the-art equipment, we can determine the crystal structure and chemical composition of crystallized inorganic materials at the atomic level. We can determine the presence of various crystal defects (dislocations, stacking faults, vacancies) and with energy dispersive X-ray spectroscopy (EDS) and electron energy loss spectroscopy (EELS) we can determine the chemical composition, the distribution of individual elements and the valence state of some elements. With a special technique (tomography) we can perform 3D imaging. |