| X-Ray Diffraction-XDR | |
|---|---|
| Laboratory | D09/L20 |
| Equipment | X-Ray Powder Diffractometer PANalytical X'Pert PRO MPD X-Ray Powder Diffractometer PANalytical X'Pert PRO (HTK) X-Ray Powder Diffractometer Malvern PANalytical Empyrean |
| Field | Chemical analysis |
| Platform | XRD analysis |
| Technics | X-Ray Powder diffraction |
| Contact | Nataša Zabukovec Logar |
| Description | High-resolution X-Ray Powder Diffractometer PANalytical X'Pert PRO MPD (radiation wavelength CuKα1 = 1.5406 Å) for measurements of powder patterns on four different configuration: (1) α1 with Johansson monochromator, for flat samples, (2) capillary transmission with hybrid monochromator, (3) standard Bragg-Brentano, and (4) parallel beam; X-Ray Powder Diffractometer PANalytical X'Pert (HTK) (radiation wavelength CuKα1 = 1.5406 Å) for measurements at T up to 1200°C and in different non-corrosive atmospheres: X-Ray Powder Diffractometer Malvern PANalytical Empyrean (Cu, Mo, Ar radiation wavelenghts) |
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