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    Rentgenska difrakcija-XRD
    LaboratorijD09, Laboratorij L20
    OpremaX-Ray Powder Diffractometer PANalytical X'Pert PRO MPD
    X-Ray Powder Diffractometer PANalytical X'Pert PRO (HTK)
    X-Ray Powder Diffractometer Malvern PANalytical Empyrean
    PodročjeKemijska analiza
    PlatformaXRD analiza
    TehnikaRentgenska praškovna difrakcija
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    +386 1 4760 371

    OpisHigh-resolution X-Ray Powder Diffractometer PANalytical X'Pert PRO MPD (radiation wavelength CuKα1 = 1.5406 Å) for measurements of powder patterns on four different configuration: (1) α1 with Johansson monochromator, for flat samples, (2) capillary transmission with hybrid monochromator, (3) standard Bragg-Brentano, and (4) parallel beam; X-Ray Powder Diffractometer PANalytical X'Pert (HTK) (radiation wavelength CuKα1 = 1.5406 Å) for measurements at T up to 1200°C and in different non-corrosive atmospheres: X-Ray Powder Diffractometer Malvern PANalytical Empyrean (Cu, Mo, Ar radiation wavelenghts)
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